Aisle width

≤550mm

Traffic speed

20-30 persons/min

Power

AC 220V ±10%

Voltage

DC 24V ±5%

Nominal power

120W

Frequency

50~60Hz

IP Grade

IP55

Environment temperature

-25℃~70℃

Electromagnet voltage

DC 24V ±5%

Drive signal access

12V Status dry contact

Running test

3 million times, trouble-free operation

Communication access

TCP/IP、RS485、Wiegand 26

Code of reading card

Second generation ID card, residence card, IC card /ID card, CPU card, etc.

Outer size

1400*280*980mm

Weight

85kg(single core)，115Kg(double cores)

Applicable field

Indoor or outdoor (rain shelter should be installed outside use)

Material

“Snowflake” grain 304 stainless steel

Main configuration requirements

3 sets of gate assembly;

3 sets of gate controller;

3 IC card readers;

Access to Infrared and button;

Supporting ESD test main board 1PC (including supporting power supply);

1 feet test pedal;

1 GB standard power bank plug;

Supporting access control management software 1PC.

Access control performance index

Speed: >30 persons/min(Normally closed mode, not test ESD),>12 persons/min(Normally closed mode, not test ESD)

Opening and closing time: 0.2 s

Average number of failures: >3 million

Swing gate controller can store 80,000 IC card information and 320,000 personnel passing records.

Access control function requirements

Have identification system, that is, IC read-write system can grant pass permission to passer. Select personnel test/pass mode according to authorization (including wrist strap, feet, wrist strap and feet, wrist strap or feet, no permission, infinite permission, etc.);

Have the function to pass the test once in the set period and do not need to test again.

At least 8 normally open periods can be set within 24 hours, and the down/upper gate will be automatically lowered according to the set period.

It is convenient for software personnel to import and export records. Personnel card records are automatically stored, easy to inquire and extract;

Have the function of fault self-check and alarm prompt;

The gate is equipped with a direction indicating system to facilitate passers to pay attention to whether the current equipment operation status is allowed;

It can realize network operation and offline operation according to customers' requirements;

All intelligent devices have fully considered the security requirements. After the system is cut off, the channel remains open;

Standard input and output interfaces facilitate the integration of the channel system with other devices;

After the read-write system reads the valid signal, it will be electrically unlocked and electrically drive bar, passers can pass without drive bar.

Communication requirements

The system is stable without communication abnormality (except equipment failure)

Capable of multiple series connection with PC network

ESD measures the performance of the motherboard

The system resistance of the wrist strap/shoes can be tested.

Single-wire and dual-wire wrist bands can be tested simultaneously.

Feet can be tested simultaneously.

The test results are automatically recorded and the test data can be queried and counted up and found abnormal data.

ESD test main board functional requirements

Test range of 750K~100MΩ

Factory setting: upper limit 35M, lower limit 750K; FOOT upper limit 35M, lower limit 750K. Specific parameter can be set according to customers’ requirements.

Within the scope of 750K~100MΩ, Testing accuracy is: 5~10%.

Operating temperature

-10℃~50℃

Display lamp

Display test results in different colors:

Test motherboards: red - high resistance, green - OK, yellow - low resistance

Access control light: red - not allowed, green – normal

Power

Input: 220V、50Hz

Meet other requirements:

1. The wrist strap socket is placed on top of the gate. The integrated single-wire wrist strap and dual-wire wrist strap socket are on the lower side of the board.

2. Place the pedal according to the customer's requirements.

3. Integrate door open button and infrared induction, remove the card reader.

4. The current test is upper and lower limit test evaluation.